DSOI technology that is twice as sensitive as conventional radial plasma view systems
GigE readout system enables spectra transport in less than 100 ms for faster analysis times.
LDSMOS generator eliminates the need for external cooling: analyze complex sample matrices at lower dilutions to lower detection limits.
Comes with the ICP Analyzer Pro Software

DSOI technology

Solving the major problem with plasma image design, SPECTRO's DSOI technology uses a vertical plasma torch. The plasma torch is observed by a new variety of direct radial view technology. The SPECTROGREEN has two optical interfaces, which collect the emitted light from both sides of the plasma. All this with just one extra reflection, for extra sensitivity and elimination of problems with dual-view models with vertical torch. In this way, DSOI provides twice the sensitivity of conventional radial systems and avoids the complexity of dual-view vertical models.

Applications

The SPECTROGREEN is ideal for analyzing trace elements. In addition, the spectrometer has significant advantages when handling samples with challenging matrices, including certain wastewaters, soils and sludge. Also for samples containing industrial chemicals, high salt contents and metals. The ICP-OES analyzer is suitable for routine analyzes in environmental and agronomy applications, as well as for the safety of consumer products, pharmaceuticals, cosmetics and food.

Price quality

The SPECTROGREEN has a good price/quality ratio. This is mainly due to the low operating costs associated with the spectrometer. The ICP-OES analyzer saves on consumables through a low-purge optical design (no-purge is also possible with the innovative UV-PLUS option). The spectrometer does not require any additional cooling, meaning that external chillers are not required.

Software

The SPECTROGREEN comes with the latest ICP Analyzer Pro Software, of course. The software is very user-friendly and makes analysis completely transparent and traceable.

Specifications

Polychromator	Thermally stabilized to +32°C ± 0.5°C Hollow section design in double Paschen-Runge mounting 750 mm focal length Holographic concave master grating Grating material Zerodur Full 1st order wavelength coverage Wavelength range: 165 - 770 nm Entrance slits width: 15 µm
Detector	15 Hamamatsu linear CMOS arrays, wavelength range optimized 4096 pixels per array Optical resolution: 165-285 nm 8 pm, >285 nm 16-23 pm Thermally stabilized optical system (+32°C ± 0.5°C) Parallel readout architecture On board digital signal processor for each detector array Intelligent data acquisition and data reduction system Dynamic range up to 9 orders of magnitude Shortest integration time 0.1 ms Shortest measurement time for one analysis: 4 sec (includes measurement and evaluation of the complete spectrum) Integration time automatically optimized for each pixel according to signal height Full spectrum access Automatic dark current correction
UV System	Ar or N2* purge, optimized for low pure rates (purge required for measurements < 190nm) Argon/Nitrogen flow rate: 0.5 l/min High purge of 4 l/min available for fast startup Optional UV-PLUS System Gas (Argon) filled hollow section, sealed, no consumable purge gas required Automatic gas purifying system Lifetime of the purifying cartridge: 24 months Dual Window entrance optics, easy to maintain
RF-Generator	LDMOS solid state design Frequency: 27.12 MHz, free running type RF power output: 0.5 to 1.7 kW Power efficiency: >85% Power stability <0.1% Automatic plasma ignition Stand-by mode (low power, low argon) Fully computer controlled Air cooled (No external cooling required) Side-On Plasma Interface (SPI) Argon purged light path Argon flow rate: 0.5-0.8 l/min TDS tolerance: up to 30%